FYS4340 – Transmission Electron Microscopy, -diffraction and spectroscopy I
Schedule, syllabus and examination date
The course gives a theoretical and practical introduction to the principles of transmission electron microscopy (TEM). The course will cover central electron microscopy, diffraction, and spectroscopy methods used to describe structures, lattice faults, and chemistry of inorganic materials. The methods cover imaging in TEM and Scanning-TEM (STEM) modes, diffraction with parallel beam illumination, energy dispersive X-ray spectroscopy (EDS), and electron energy loss spectroscopy (EELS). The theory is based on a kinematical description. However, a qualitative description of the effect of multiple (dynamical) scattering will be given. The course is aimed at both students that plan to continue with additional training to become TEM operators and for those only targeting a theoretical insight.
After completing this course, you can:
- evaluate which sample preparation technique is the most appropriate for a given sample/material question.
- describe the construction and work principles of S/TEMs.
- start using standard software for TEM data analysis/handling.
- give an oral summary of experiments and results from a S/TEM-based scientific paper.
- index electron diffraction patterns.
- describe the origin and use of Kikuchi patterns.
- describe the procedure and choice of experimental conditions for imaging structures and lattice faults.
- describe the principles behind EDS and EELS and their strengths and weaknesses for sample chemistry determination.
- discuss the effect of dynamical scattering on diffraction, spectroscopy, and imaging.
Admission to the course
Students admitted at UiO must apply for courses in Studentweb. Students enrolled in other Master's Degree Programmes can, on application, be admitted to the course if this is cleared by their own study programme.
Nordic citizens and applicants residing in the Nordic countries may apply to take this course as a single course student.
If you are not already enrolled as a student at UiO, please see our information about admission requirements and procedures for international applicants.
Recommended previous knowledge
- 10 credits overlap with FYS9340 – Diffraction Methods and Electron Microscopy.
The course extends over a full semester, with up to 4 hours of teaching per week (lectures and problem solving/instrument demonstrations).
You will receive an individual scientific article, which you must familiarize yourself with and present to the other students. This presentation must be completed and approved before you can sit the final exam.
- Final oral exam which counts 100% towards the final grade.
The presentation of a relevant scientific article must be completed and approved before you can sit the final exam.
It will also be counted as one of the three attempts to sit the exam for this course, if you sit the exam for one of the following courses: FYS9340 – Diffraction Methods and Electron Microscopy
Examination support material
No examination support material is allowed.
Grades are awarded on a scale from A to F, where A is the best grade and F is a fail. Read more about the grading system.
Resit an examination
Students who can document a valid reason for absence from the regular examination are offered a postponed exam at the beginning of the next semester.
New examinations are offered at the beginning of the next semester for students who do not successfully complete the exam during the previous semester.
We do not offer a re-scheduled exam for students who withdraw during the exam.