FYS4340 – Transmission Electron Microscopy: imaging, diffraction and spectroscopy I

After completing this course, you can:

• evaluate which sample preparation technique is the most appropriate for a given sample/material question.
• describe the construction and work principles of S/TEMs.
• start using standard software for TEM data analysis/handling.
• give an oral summary of experiments and results from a S/TEM-based scientific paper.
• index electron diffraction patterns.
• describe the origin and use of Kikuchi patterns.
• describe the procedure and choice of experimental conditions for imaging structures and lattice faults.
• describe the principles behind EDS and EELS and their strengths and weaknesses for sample chemistry determination.
• discuss the effect of dynamical scattering on diffraction, spectroscopy, and imaging.

Students admitted at UiO must apply for courses in Studentweb. Students enrolled in other Master's Degree Programmes can, on application, be admitted to the course if this is cleared by their own study programme.

Nordic citizens and applicants residing in the Nordic countries may apply to take this course as a single course student.

If you are not already enrolled as a student at UiO, please see our information about admission requirements and procedures for international applicants.

• FYS3400 – Condensed Matter Physics and Quantum Materials

The course extends over a full semester, with up to 6 hours of teaching per week:

• 2 hours of lectures
• Up to 4 hours of colloquia/lab exercises

You will receive an individual scientific article, which you must familiarize yourself with and present to the other students. This presentation must be completed and approved before you can sit the final exam.

See rules for mandatory activities.

• Final oral exam which counts 100% towards the final grade.

The presentation of a relevant scientific article must be completed and approved before you can sit the final exam.

This course has mandatory exercises that must be approved before you can sit the final exam.

It will also be counted as one of the three attempts to sit the exam for this course, if you sit the exam for one of the following courses: ​FYS9340 – Transmission Electron Microscopy: imaging, diffraction and spectroscopy I

Students who can document a valid reason for absence from the regular examination are offered a postponed examination at the beginning of the next semester.

Re-scheduled examinations are not offered to students who withdraw during, or did not pass, the original examination.