FYS9340 – Diffraction Methods and Electron Microscopy
Schedule, syllabus and examination date
Changes in the course due to coronavirus
Autumn 2020 we plan for teaching and examinations to be conducted as described in the course description and on semester pages. However, changes may occur due to the corona situation. You will receive notifications about any changes at the semester page and/or in Canvas.
Spring 2020: Teaching and examinations was digitilized. See changes and common guidelines for exams at the MN faculty spring 2020.
The course gives a theoretical and practical introduction to the principles of transmission electron microscopes (TEM). The course will cover central microscopy, diffraction and spectroscopy methods used to describe structures, lattice faults, and chemistry of inorganic materials. The methods cover imaging in TEM and Scanning-TEM (STEM) modes, diffraction with parallel beam illumination, energy dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS). The theory is based on a kinematical description. However, a qualitative description of the effect of multiple (dynamical) scattering will be given. The course is aimed for both PhD candidates that plan to continue with additional training to become TEM operators and for those only targeting a theoretical insight.
After completing this course, you should be able to:
- evaluate which sample preparation technique that is the most appropriate for a given sample/material question.
- describe the construction and work principles of S/TEMs.
- start using standard software for TEM data analysis/handling.
- give an oral summary of experiments and results from S/TEM based scientific papers.
- index electron diffraction patterns.
- describe the origin and use of Kikuchi patterns.
- describe the procedure and choice of experimental conditions for imaging structures and lattice faults.
- describe the principles behind EDS and EELS and their strengths and weaknesses for sample chemistry determination.
- discuss the effect of dynamical scattering on diffraction, spectroscopy, and imaging.
Admission to the course
PhD candidates from the University of Oslo should apply for classes and register for examinations through Studentweb.
If a course has limited intake capacity, priority will be given to PhD candidates who follow an individual education plan where this particular course is included. Some national researchers’ schools may have specific rules for ranking applicants for courses with limited intake capacity.
PhD candidates who have been admitted to another higher education institution must apply for a position as a visiting student within a given deadline.
Recommended previous knowledge
- 10 credits overlap with FYS4340 – Diffraction Methods and Electron Microscopy.
The course extends over a full semester, with up to 4 hours of teaching per week (lectures and problem solving/instrument demonstrations).
Each student will receive an individual scientific article, which they must familiarize with and present to the other students. This presentation must be completed and approved before you can sit the final exam.
The presentation of a relevant scientific article must be completed and approved before you can sit the final exam.
- Final oral exam which counts 100% towards the final grade.
It will also be counted as one of the three attempts to sit the exam for this course, if you sit the exam for one of the following courses: FYS4340 – Diffraction Methods and Electron Microscopy
Examination support material
No examination support material is allowed.
Grades are awarded on a pass/fail scale. Read more about the grading system.
Resit an examination
This course offers both postponed and resit of examination. Read more: